Products

Eumetrys provides optical metrology, particles inspection, layer thickness measurement, Photoluminescence mapping system, crystal defects and stacking faults classification, micro LEDs review and micro/macro PL for VIS and NIR application tools.

We sell new and remanufactured equipment to semiconductor industrials and laboratories. Discover our Inspectrology IVS models for CD and Overlay measurement, YGK for surface contamination analysis, ETAMAX's PLATO for Photoluminescence mapping system, MiPLATO SiC for crystal defects and stacking faults classification as well as MICRO LED for micro LEDs review and MICROSCAN for a all-in-one tool for VIS and NIR applications.

Services

Eumetrys offers maintenances, trainings, and process analysis in Europe, Asia and North America.

We provide preventive and curative maintenances, adaptive multi-level trainings or advanced data analysis. Together, control and optimize your production processes. Discover our full services offer by clicking here.

Technology

Eumetrys addresses standard and compound semiconductor, MEMS, LED and substrates industries.

We provide the most flexible and accurate metrology and particles inspection equipment with the best cost of ownership for a great number of key processes for III-V semiconductors, telecommunications, waveguides, VCSEL or power devices.

Applications

Eumetrys helps you to improve and to optimize your production support processes.

Our expert engineers help you to automate stepper control and qualification. Eumetrys’ specialists follow your process engineers in their contamination analyze of your opaque and transparent substrates as well as the optimum use of our layer thickness measurement tool.

Company

Eumetrys is an international company of semiconductor experts for more than 20 years.

Learn more about us. Discover our history, our team of experts and our partnerships. Read our publications. Check what our customers and what the media say about us.

Contact

Request a virtual demonstration of our Inspectrology IVS and see its performances for yourself!

Eumetrys and its teams are available to answer any demand about our services and optical metrology, particles inspection, and reflectometry products.

News
 

Eumetrys Featured in Exclusive Interview on Forbes France

Eumetrys steps into the spotlight! Don’t miss the exclusive interview with our CEO Yannick Bedin by Jean-Marc Sylvestre for Forbes France. A deep dive into the future of semiconductors and advanced technologies.

 

IVS Top Cover is now available for all IVS tools

EUMETRYS and INSPECTROLOGY are pleased to release the new IVS Top Cover.

 

EUMETRYS support its product line using the new 3D Virtual Reality technology

EUMETRYS is pleased to demonstrate its technology to its customers using Virtual Reality capabilities directly available from our web site.

 

Yannick BEDIN, EUMETRYS’ CEO’s interview, on BFM Business TV – “Decoding” programme – (September 2022)

Electronic chips are everywhere in our daily lives. In our mobile phones, our computers, our headphones, our cars... Eumetrys is an expert in metrology for the electronic chip industry.

 

EUMETRYS GmbH: Our new subsidiary in Germany

The semiconductor industry is a pillar of our EUROPEAN economy.

Increasing our manufacturing autonomy is urgent.