Our support equipment for VCSEL laser manufacturing
for automotive
Critical dimension (CD), and VIA, particles inspection
on opaque and transparent substrates
Solid state lasers manufacturers are today in tight competition as the field of applications have dramatically increased – and in particular the VCSEL, a key challenge for a lot of our customer manufacturing sites.
The challenge is in the power output as well as emission wavelength accuracy: tightest measurement control is the main response to achieve performant laser structure.
Inspectrology IVS systems allow our customers to achieve best performances on their laser manufacturing by providing a full solution of precise and accurate measurement that we are able to correlate with the NIST traceable etalon as per the automotive quality control constant demand.
YGK particles inspection equipment meets semiconductor industries’ needs but also compound semiconductor factories. They can analyze contamination of opaque and transparent wafers. We have the expertise and we provide support to our customers to match the tight quality control required by their end customers.

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