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EUMETRYS support its product line using the new 3D Virtual Reality technology

EUMETRYS is pleased to demonstrate its technology to its customers using Virtual Reality capabilities directly available from our web site.

NUMIX company, specialist of 3D Virtual Reality and Augmented Reality, was driving the project of highlighting the main key added values of the IVS200 product line to our customers. They helped us to integrate the versatility of the IVS system and measurement flexibility.

The 3D is showing all available options that can be proposed on this system: HSMS GEM Automation, IVS tool remote access, offline recipes generation, automatic offline recipes generation, OCR, new measurement templates on demand to suits your needs.


Please test your wafer size and measurement type directly on the EUMETRYS web site
by selecting the DEMO tab – Click here.

EUMETRYS support its product line using the new 3D Virtual Reality technology



EUMETRYS is pleased to demonstrate its technology to its customers using Virtual Reality capabilities directly available from our web site.

NUMIX company, specialist of 3D Virtual Reality and Augmented Reality, was driving the project of highlighting the main key added values of the IVS200 product line to our customers. They helped us to integrate the versatility of the IVS system and measurement flexibility.

The 3D is showing all available options that can be proposed on this system: HSMS GEM Automation, IVS tool remote access, offline recipes generation, automatic offline recipes generation, OCR, new measurement templates on demand to suits your needs.


Please test your wafer size and measurement type directly on the EUMETRYS web site
by selecting the DEMO tab – Click here.





EUMETRYS: EUROPEAN Metrology Company for a NanoWorld

EUMETRYS is pleased to introduce the best COO automatic metrology system for CD, Via, large film thickness and Overlay Registration measurement: the new IVS200 system. This tool is the system of choice for metrology when the factors reliability and flexibility are part of the key advantages required by your facilities.

EUMETRYS: EUROPEAN Metrology Company for a NanoWorld



EUMETRYS is pleased to introduce the best COO automatic metrology system for CD, Via, large film thickness and Overlay Registration measurement: the new IVS200 system. This tool is the system of choice for metrology when the factors reliability and flexibility are part of the key advantages required by your facilities.





The CJD: Center of the Young Entrepreneurs

EUMETRYS CEO is part of the National Entrepreneurs Union called the CJD: Center of the Young Entrepreneurs.

This group is promoting entrepreneur training as well as events like the important events in Albi about the AI : who would be the brain ?

We invited a philosopher and an expert on the AI to debate on the workers job role in tomorrow’s world when the robots would replace the  employees.

The CJD: Center of the Young Entrepreneurs



EUMETRYS CEO is part of the National Entrepreneurs Union called the CJD: Center of the Young Entrepreneurs.

This group is promoting entrepreneur training as well as events like the important events in Albi about the AI : who would be the brain ?

We invited a philosopher and an expert on the AI to debate on the workers job role in tomorrow’s world when the robots would replace the  employees.