Media and press releases
What the medias say about EUMETRYS
New Partnership with Merconics
Growing our activity in Germany


EUMETRYS concluded an association with Merconics which is in charge of our business development for the Overlay and CD Optical metrology System in Germany
New Partnership withMerconics            
                               
We are pleased to work with Merconics to develop our business in Germany.
 
If you need more information about our Optical metrology System to measure Overlay, CD and MEMs features on the SiC, GaAs, GaN, Glass, Quartz, MEMs and LED substrates as well as standard Silicon wafers please do not hesitate to contact HARALD MODER at Merconics.