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New partnership with Merconics to
grow our activity in Germany

EUMETRYS concluded an association with Merconics which is in charge of our business development for the overlay and CD optical metrology system in Germany.
We are pleased to work with Merconics to develop our business in Germany.
If you need more information about our optical metrology system to measure overlay, CD and MEMs features on the SiC, GaAs, GaN, Glass, Quartz, MEMs and LED substrates as well as standard silicon wafers please do not hesitate to contact HARALD MODER at Merconics.